Lodéa N, Nunes W, Zanini V, Sartori M, Ost L, Calazans N, Garibotti R, Marcon C. Early Soft Error Reliability Analysis on RISC-V. IEEE LAT AM T [Internet]. 2022 Jun. 28 [cited 2024 Jul. 22];20(9):2139-45. Available from: https://latamt.ieeer9.org/index.php/transactions/article/view/6245