CERVANTES ALVAREZ, S.; MEXICANO SANTOYO, A.; CERVANTES, J. A.; RODRÍGUEZ, R.; FUENTES PACHECO, J. Binary Pattern Descriptors for Scene Classification. IEEE Latin America Transactions, [S. l.], v. 18, n. 1, p. 83–91, 2020. Disponível em: https://latamt.ieeer9.org/index.php/transactions/article/view/919. Acesso em: 5 may. 2024.