HERNANDEZ, G. R.; NAVARRO, M. A.; ORTEGA-SANCHEZ, N.; OLIVA, D.; PEREZ-CISNEROS, M. Failure Detection on Electronic Systems Using Thermal Images and Metaheuristic Algorithms. IEEE Latin America Transactions, [S. l.], v. 18, n. 8, p. 1371–1380, 2020. Disponível em: https://latamt.ieeer9.org/index.php/transactions/article/view/2317. Acesso em: 1 may. 2024.