MARTINS, J.; LOPEZ-CABREJOS, J.; LEHER, Q.; PAIXÃO, T.; ALVAREZ, A. B.; PALOMINO-QUISPE, F. Defect Detection in Printed Circuit Boards: A Comparative Analysis of Object Detection Models with Depthwise Convolution Adaptation. IEEE Latin America Transactions, [S. l.], v. 23, n. 11, p. 1001–1010, 2025. Disponível em: https://latamt.ieeer9.org/index.php/transactions/article/view/9899. Acesso em: 9 jul. 2026.